Instrument: Bruker TS77
Manufacturer: Bruker
General Description: Bruker Hysitron nanoindenters measure mechanical properties at nanoscale through instrumented indentation. The systems employ capacitive transducer technology to apply controlled forces while continuously measuring probe displacement during contact with materials. The transducer design provides force and displacement measurement capabilities enabling characterization of elastic modulus, hardness, creep, and fracture toughness. Various models support quasi-static indentation, dynamic oscillatory measurements, nanoscratch, nanowear, and scanning probe microscopy imaging. Advanced control electronics enable high-speed property mapping across sample surfaces. Environmental stages allow testing under controlled temperature or atmospheric conditions. Multiple probe geometries accommodate different material classes from soft hydrogels to hard ceramics. Applications span thin film characterization, coating evaluation, biomaterial assessment, and microscale mechanical heterogeneity mapping across metallurgy, semiconductor, and composite materials research.