Instrument: Asylum MFP-3D Origin+
Manufacturer: Oxford Instruments
General Description: The Oxford Instruments MFP-3D Origin atomic force microscope performs nanoscale surface characterization through probe-sample interactions. A flexured closed-loop scanner provides controlled three-dimensional positioning with sub-nanometer resolution across large scan ranges. The system supports various imaging modes including contact, tapping, and force spectroscopy techniques. Environmental capabilities enable measurements in air, controlled atmosphere, or liquid environments. Nanomechanical characterization modes assess viscoelastic properties including storage and loss moduli. Nanoelectrical measurements characterize conductivity, piezoelectric response, and surface potential distributions. Optional accessories extend capabilities for magnetic field application, temperature control, and sample manipulation. Software provides automated calibration, measurement routines, and data analysis tools. The instrument accommodates diverse sample types from polymers to biological materials through interchangeable probe holders and measurement configurations. Applications span materials science, biophysics, semiconductor characterization, and polymer analysis.