Instrument: Keysight/Agilent 5500
Manufacturer: Keysight Technologies
General Description: The Keysight atomic force microscope system performs high-resolution surface imaging and property measurements through cantilever-based scanning probe techniques. The instrument employs closed-loop scanner technology for precise three-dimensional positioning control. Multiple operation modes enable topography mapping, phase imaging, and force-distance spectroscopy across various sample types. Environmental control options support measurements under controlled temperature, atmosphere, or liquid immersion conditions. The system features automated approach mechanisms and software-guided measurement procedures to facilitate operation. Digital signal processing electronics enable real-time feedback control and data acquisition. Various cantilever configurations accommodate different force ranges and spatial resolutions. Interchangeable measurement modules extend capabilities for electrical, magnetic, or mechanical property characterization. Applications include surface roughness analysis, thin film characterization, nanostructure evaluation, and local property mapping across semiconductor devices, polymers, biological samples, and nanomaterial research.