Instrument: Keyence VK-X3050
Manufacturer: Keyence
The Keyence VK-X3000 series combines laser confocal microscopy with interferometric techniques for three-dimensional surface profiling. A violet laser scans across surfaces while confocal optics reject out-of-focus light to measure height information. The system integrates multiple measurement modes including laser confocal scanning, focus variation, and white light interferometry for characterizing diverse surface types. Motorized stages enable large-area mapping through stitching of multiple fields of view. The instrument measures surface topography, roughness parameters, step heights, and volumetric features. Software provides automated analysis including profile extraction, area calculations, and statistical surface characterization. The non-contact measurement approach accommodates reflective, transparent, or steeply angled surfaces. Applications span quality control inspection, wear analysis, coating thickness measurement, and micro-feature characterization across semiconductor, materials science, and manufacturing quality assurance environments.