Instrument: Tescan Vega 3
Manufacturer: Tescan
General Description: The TESCAN VEGA scanning electron microscope provides surface imaging and compositional analysis using a tungsten filament electron source. The system features wide field optics enabling navigation across broad magnification ranges. Multiple detection modes including secondary electron and backscattered electron detection reveal topography and compositional contrast. Variable pressure operation accommodates non-conductive samples without coating through controlled chamber pressure. Integrated energy dispersive spectroscopy enables elemental identification and mapping within the same software interface. In-flight beam tracing technology automatically optimizes electron optics during operation. The large specimen chamber accommodates diverse sample sizes with motorized stage positioning. Digital image acquisition captures high-resolution data across scanning conditions. Applications include materials characterization, failure analysis, quality control inspection, surface morphology studies, and elemental distribution mapping across metallurgy, geology, electronics, and biological specimens.